The HIMA H41q and H51q system families are third-generation programmable electronic systems that have been field validated and designed specifically for safety critical applications in the process industry. These two system families are based on the same hardware and software platform, mainly used to control process flows with extremely high safety and availability requirements such as chemical plants, refineries, and power plants.
The core design philosophy of HIMA PES is to balance safety and usability. HIMA PES can be configured as a single channel or dual channel (redundant) system based on the required safety level (requirement levels AK 1 to 6 in accordance with DIN V 19250 standard) and availability requirements. This flexibility is not only reflected in the central module, but also applies to input/output modules and I/O buses, providing users with a complete solution from basic safety to the highest availability safety system.
The system configuration uses the ELOP II programming system to input, compile, load, test, and monitor user programs through a personal computer. All HIMA modules comply with the requirements of the EU EMC Directive 89/336/EWG and bear the CE mark, ensuring electromagnetic compatibility in harsh industrial environments.
7.4 Buffer battery replacement
The central module uses lithium batteries (such as CR 2477N) to buffer sRAM. HIMA recommends replacing the battery every 2.5 years or within three months when the "BATE" indicator appears on the display screen.
Technical Data Summary
Working temperature: 0 ° C to+60 ° C
Storage temperature: -40 ° C to+85 ° C (without battery)/-40 ° C to+75 ° C (with battery)
Supply voltage: 24 V DC (+20%/-15%)
EMC immunity: Complies with EN 50082-2 industrial environment standards, including ESD contact 6 kV, air 8 kV, Burst 2 kV, and other tests.
EMC emission: Complies with EN 50081-2 industrial environmental standards, with limits meeting Class A requirements.
Mechanical testing: Complies with the IEC 68 series standards, including sine vibration (1g) and impact (15g/11ms) testing.

