Product Overview
The National Instruments PXIe-4138 is a system source measure unit for PXI Express systems. It provides a single channel that can source and measure both voltage and current with high precision. The instrument is designed for semiconductor device characterization, electronic component test, and research applications that require accurate control of electrical bias and sensitive measurement of the device response.
The PXIe-4138 is part of the NI source measure unit family. It combines source and measurement functions in one module, which simplifies wiring and test sequencing compared with separate supplies and meters. Because it is a PXI Express instrument, it can be integrated with switches, DMMs, digitizers, and other modules in a single chassis for complete device test.
Source and Measure Capability
The module can source voltage and current under software control and measure voltage and current to verify device behavior. This source and measure combination supports current voltage characterization, leakage measurement, and power consumption testing. Engineers should confirm the exact voltage and current ranges, resolution, and accuracy for the specific configuration against the product documentation.
High sensitivity current measurement is important for characterizing low leakage devices, advanced semiconductor processes, and high impedance sensors. Careful shielding, guarding, and cable management are required to achieve the specified performance at low current levels, because leakage paths and noise can dominate otherwise.
Precision and Stability
The PXIe-4138 is designed for stable, repeatable measurements. Internal references and careful thermal design support accuracy over time and across the operating range. Engineers should allow adequate warm up and settling time before critical measurements, especially when changing ranges or making low current measurements.
Calibration and verification are important for maintaining confidence in precision source measure units. The module supports calibration procedures that establish traceability. Engineers should record calibration dates and results, and should verify performance with known standards when the instrument is used for critical device qualification.
Protection and Device Safety
When testing valuable or sensitive devices, protection features and correct compliance settings are essential. The module supports voltage and current limits that can prevent damage if a device behaves unexpectedly. Engineers should set compliance values appropriate to the device and should understand how the instrument responds when a limit is reached.
Test fixtures should be designed to protect both the device and the instrument. Guarding, shielding, and proper grounding reduce leakage and noise, while fusing and transient protection reduce the risk of damage from device failure. These practices are especially important in semiconductor and component test environments.
Software and PXI Integration
The PXIe-4138 is supported by NI instrument driver software and can be programmed with LabVIEW, LabWindows/CVI, Measurement Studio, and other compatible development environments. Engineers can configure source functions, measurement ranges, compliance limits, and timing through the driver. Automated sequences can apply bias, measure response, and evaluate results consistently.
Within a PXI Express chassis, the module can be synchronized with switches, DMMs, and digitizers. This allows a test to route signals, apply power, measure parameters, and capture waveforms in one sequence. Shared timing and triggering resources help coordinate the SMU with the rest of the test system.
Typical Applications
Semiconductor device current voltage characterization
Leakage current and power consumption measurement
Electronic component and circuit validation
Sensor and high impedance device test
Automated production test with signal switching
Laboratory research and device evaluation
The PXIe-4138 provides precision voltage and current sourcing and measurement in a PXI Express source measure unit. Its sensitivity, protection features, and PXI integration make it suitable for semiconductor and electronic device test applications.
