Product Overview
The National Instruments PXIe-6570 is a digital pattern instrument for PXI Express systems. It occupies two PXI Express slots and provides high speed digital stimulus and response capture for semiconductor and digital electronic devices. The instrument supports a vector rate up to 100 MVector/s, making it suitable for characterization, validation, and production test of digital interfaces.
The PXIe-6570 is part of the NI semiconductor and digital test product family. It is used with NI software and pattern development tools to define pin maps, timing sets, levels, and test sequences. The PXI Express form factor allows the instrument to be integrated with source measure units, switches, digitizers, and other instruments in a single chassis.
Channels and Vector Rate
The PXIe-6570 provides a high channel count of digital pins with per pin timing and level control. Each pin can be configured as an input, output, or bidirectional signal. The instrument supports vector rates up to 100 MVector/s, which allows testing of digital devices that operate at high clock frequencies. High vector rate and per pin flexibility make the instrument useful for protocol based devices as well as general digital logic.
Deep vector memory supports long test patterns and complex sequences. Engineers can define pattern timing, strobe placement, and drive and compare edges. This level of control is important when validating setup and hold margins, timing violations, and protocol behavior in digital devices.
Per Pin Timing and Levels
The PXIe-6570 provides per pin timing and voltage level settings. This allows different pins to operate with different timing and logic levels in the same pattern, which is essential for mixed logic devices and multi protocol interfaces. Per pin control simplifies test development for devices that combine several digital interfaces in one package.
Pin electronics support programmable drive and compare levels within the instrument specifications. Engineers can define input thresholds and output levels to match the device under test. Careful pin mapping and level configuration help avoid damage to the device and improve measurement correlation with bench equipment.
Parametric Measurement
The instrument includes per pin parametric measurement capability for DC testing. This allows engineers to measure leakage current, input voltage thresholds, and output drive characteristics without switching to a separate instrument. Combining digital pattern test and parametric measurement in one instrument reduces test time and simplifies system wiring.
Parametric measurement is useful in semiconductor characterization, where DC parameters and digital function must both be verified. Engineers should confirm the measurement ranges and accuracy specifications for the specific test requirements and use appropriate device interface boards for reliable connection.
Software and PXI Integration
The PXIe-6570 is supported by NI software for digital pattern test, including pattern editing and sequencing tools. Applications can be developed in LabVIEW and other NI environments, and the instrument can be integrated into larger test programs. The instrument supports synchronization with other PXI Express modules through trigger lines and timing resources.
Because the PXIe-6570 is a PXI Express instrument, it can be combined with source measure units, DMMs, switches, and digitizers in one chassis. This integration supports complete device test in a single system. Engineers can build test sequences that apply power, run digital patterns, measure DC parameters, and log results.
Typical Applications
Digital device characterization and validation
Semiconductor production test
Protocol and interface testing
Mixed logic device test with per pin levels
DC parametric measurement on digital pins
Multi instrument PXI Express test systems
The PXIe-6570 provides a two slot PXI Express digital pattern instrument with high vector rate, per pin timing and levels, and parametric measurement. Its integration with PXI Express instruments makes it suitable for digital device characterization and production test applications.
