NI PXIE-6571 32-Channel Digital Pattern Instrument
NI PXIE-6571 32-Channel Digital Pattern Instrument
INTRODUCTION
NI PXIE-6571 32-Channel Digital Pattern Instrument is a sophisticated and versatile tool designed for semiconductor characterization and production testing. Below is a detailed overview of its key features, specifications, and applications:
Key Features
32-Channel Digital Pattern Generation:
The PXIE-6571 offers 32 channels for generating digital patterns, making it suitable for testing and verifying the performance of digital circuits and systems.
Digital Pattern Editor:
It includes a digital pattern editor that allows users to view, create, modify, and debug pin and channel mappings, specifications, levels, timings, patterns, source waveforms, and capture waveform files.
Per-Pin Parameter Unit (PPMU) Functionality:
Each channel has a PPMU, enabling precise DC voltage and current sourcing and measurement for detailed device characterization.
High-Speed Data Conversion:
The instrument supports high-speed data conversion with up to 100 ks/s update rates for creating dynamic sequences.
Comprehensive Debugging Tools:
The PXIE-6571 comes with debugging tools such as shmoo, digital oscilloscope, history RAM viewer, pin state, and system state viewers.
Specifications
Voltage Range:
-2 V to 6 V for pattern generation.
-2 V to 7 V for PPMU force voltage.
Data Rate:
Up to 200 Mbps.
Clock Frequency:
Up to 160 MHz.
Power Requirements:
Requires an 82 W power supply and a chassis with sufficient cooling capabilities.
Dimensions and Weight:
Approximately 10 x 7.6 x 1.2 inches in size.
Weighs approximately 1.2 kg.
Applications
Semiconductor Testing:
The PXIE-6571 is ideal for testing semiconductor devices, including ICs, transistors, and other components.
Design Verification and Validation:
Engineers can use the instrument to verify and validate the design of digital circuits and systems, ensuring they meet specified performance requirements.
Production Testing:
The PXIE-6571 is suitable for production testing, allowing manufacturers to quickly and accurately test large volumes of devices.
Additional Information
Software Support:
The PXIE-6571 is supported by NI-Digital Pattern Driver software, which provides an interface for configuring and controlling the instrument.
It also supports National Instruments Measurement & Automation Explorer (MAX) for hardware configuration and self-test.
Integration and Expandability:
The instrument can be integrated with other NI PXI modules and systems to create a comprehensive test solution.
It supports synchronization and triggering capabilities, allowing it to be used in complex test setups.
Cooling Requirements:
It is important to note that the PXIE-6571 requires a chassis with sufficient cooling capabilities to operate correctly. A chassis with an 82 W slot cooling ability, such as the PXIE-1095, is recommended.
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