Advantest D3286 Error Detector for Error Performance Test System

Advantest D3286 Error Detector for Error Performance Test System

INTRODUCTION

To accommodate transmission of large-capacity information in the coming multimedia generation, ultra high-speed digital telecommunications netw orks are being constructed. For evaluation and analysis of O/E and E/O modules and ultra high-speed logic devices used for multiplexers and repeaters for telecommunications systems, a signal source w ith high speed and high quality is necessary. The D3186 Pulse Pattern Generator/D3286 Error Detector offers excellent w aveforms w ith high speed and high quality and diverse error detecting functions in an operating frequency range from 150 M bps to 12.5 Gbps. In addition, w ith the 8 M -bit large capacity memory and ADVANTEST's unique frame pattern generation function, the D3186/D3286 is a new generation of error performance test system w hich is compatible w ith STM -1 (155.52 M bps) to STM -64 (9.95 Gbps) in SDH/SONET.

D3286 Error Detector

SDH/SONET frame synchronization suitable for system evaluation 

Error detection w ith area specification effective for SDH frame and ATM cell measurement 

Burst data measurement effective for loop-back test 

Auto search function w hich adjusts the most appropriate timing and voltage 

Monitor output of data and clock 

FD drive for storing measurement results and setup data 

GUI environment realizing easy and legible operating environment

Offers Excellent Waveform Quality

For Performance Evaluation of Optical Components

High waveform quality is essential to evaluate the performance of laser diodes and optical components for optical telecommunication. To meet this demand, the D3186 Pulse Pattern Generator provides excellent waveforms with high speed and high quality. In addition, the D3186 has a wide cross point variable range for the output waveform that makes it easy to control the output waveform correction mark ratio.

Use As a M odulation Signal Source for Optical M odulators

When used together with the Q7606A/B Lightwave Modulation Test Set from ADVANTEST, the D3186 provides a suitable modulation signal source in a chirp measurement system for optical modulators.

Excellent Waveform Quality

Through output waveform re-timing, a data output waveform with excellent eye balance, low jitter, and low distortion has been realized.

Favorable M atching w ith 50 ohm Output Impedance

With 50 ohm output impedance matching, waveform distortion due to impedance mismatching does not occur even if a mismatched DUT is connected.

Generation of SDH/SONET Frame Patterns Close to Actual Data

For Evaluation of Optical Transmission Equipment and E/O and O/E M odules

In O/E and E/O tests of the SDH/SONET system, testing at the frame level is required. In addition to the large WORD memory with 8 M-bit length, the D3186 Pulse Pattern Generator is provided with an optional function to insert WORD patterns in the header section of the STM frame and arbitrary PRBS in the payload section, realizing test patterns which are very close to actual data. Of course, the D3286 error detector can measure errors at the header and payload sections separately. In addition, the D3286 powerfully supports location of cause of errors by means of the frame synchronization function and specific area error measurement function.