Advantest D3186-10-70 Test Pattern Generator 12 GHz

Advantest D3186-10-70 Test Pattern Generator 12 GHz

DESCRIPTION

The Advantest D3186-10-70 is a high-performance pulse code pattern generator capable of generating a wide range of pattern types, including pseudo-random (PRBS) patterns, programmable (WORD) patterns, and framing patterns for SDH or SONET structures, to meet the needs of different test scenarios.

Precautions for use

Avoid using D3186-10-70 in dusty, direct sunlight or where corrosive gases are generated.

It should be used in an environment with an ambient temperature of 0 to 40 degrees Celsius and a relative humidity of 40 to 85 per cent.

Avoid excessive mechanical shock to the unit.

As the unit has an exhaust cooling fan, leave sufficient space between the rear panel and the wall and avoid blocking the air intake holes.

Main Functional Features

High-speed and high-quality waveforms:

The operating frequency range is from 150 Mbps to 12.5 Gbps, providing high-speed and high-quality waveforms.

The excellent waveform quality makes it particularly suitable for system evaluation and performance analysis.

Multiple Pattern Generation:

Seven types of pseudo-random (PRBS) code patterns can be generated, ranging from 27-1 to 231-1.

Programmable (WORD) code patterns up to 8M bits.

Supports frame code patterns for SDH or SONET structures for telecom system testing.

Large-capacity memory and diverse outputs:

Equipped with 8M-bit mass memory to support complex and large-scale test patterns.

Multi-channel outputs, including 2 data channels, 3 clock channels and 7 sub-rate channels, provide flexible test configurations.

High accuracy and tunability:

Built-in high-precision synthetic clock generator provides 16 frequency memories and supports fast frequency setting.

For PRBS mode, the marker ratio can be changed between 8 values to meet different test requirements.

Advanced features and interfaces:

Provides ‘Alternative’ mode to switch between WORD and FRAME mode for measurement.

Supports GPIB (IEEE 488-1978) interface for complete remote control, making it easy to build measurement and test systems.

Built-in floppy disk drive for storing and recalling the contents of setup conditions and mode settings.

Stability and compatibility:

Frequency setting resolution up to 1 kHz and frequency stability of ±10 ppm/year ensure accurate test results.

Compatible with STM-1 (155.52 Mbps) to STM-64 (9.95 Gbps) pulse pattern signals in SDH/SONET.

Technical Specifications

Frequency range: 150 MHz to 12 GHz (option 10), 150 MHz to 12.5 GHz (option 13).

Frequency setting resolution: 1 kHz.

Frequency stability: ±10 ppm/year.

Frequency accuracy: 0.01%.

Operating temperature: 0°C to +40°C, +20°C to +30°C (option 72).

Operating humidity: 40% to 85% RH.

Storage temperature: -20°C to +60°C.

Storage humidity: 30% to 85% RH (non-condensing).

Power supply: AC 100 V to 120 V, AC 220 V to 240 V, 48 to 63 Hz.

Power consumption: 550 VA max.

External dimensions: approx. 310 (H) X 424 (W) X 550 (D) mm.

Application Scenarios

Advantest D3186-10-70 Test Pattern Generator is widely used in the research and development, production and testing of high-speed communication equipment, especially in optical fibre communication, digital signal processing and high-speed data transmission systems, which has an irreplaceable and important role. By combining with the D3286 BER detector, a complete test system can be constructed for evaluating key performance indicators such as BER of ultra-high-speed optical communication equipment and compound semiconductors.