Advantest Q8341 Optical Spectrum Analyzer

Advantest Q8341 Optical Spectrum Analyzer

Measures LDs with high speed and high accuracy

● High speed measurement option: 0.5 s 

● Narrow coherence measurement resolution of 0.001 mm 

● More than tenfold high wavelength accuracy of ±0.01 nm (Option) 

● High wavelength resolution option: 0.01 nm at 650 nm 

● Wide measurement wavelength range: 350 nm to 1000 nm 

● Small, lightweight platform

High Throughput Capabilities 

The Q8341 is an optical spectrum analyzer for visible radiation with a wavelength range of 350 nm to 1000 nm. Because it uses a Fourier spectrum system with a Michelson interferometer, the Q8341 can measure coherence. With its narrow wavelength resolution of 0.01 nm*, the Q8341 is very effective for the evaluation of not only CD/DVD laser diodes, but also for blue-violet laser diodes. In addition, the built-in He-Ne laser acts as a wavelength reference to ensure a high wavelength measurement accuracy of ±0.01nm*. Finally, with its fast 0.5 s* measurement speed, the Q8341 is ideal for evaluating temperature characteristics of system components.

● Coherence measurement resolution: 0.001 mm 

●Wavelength resolution (at 650 nm): 0.05 nm (standard), 0.01 nm (option) The measured resolution of the peak wavelength is 0.001 nm 

●Wavelength measurement accuracy: ±0.05 nm (standard), ±0.01 nm (option) 

●Max. input level: ±10 dBm 

●Max. Coherence measurement length: Approx. 10 mm (standard), Approx. 40 mm (option) 

●Wavelength measurement range: 350 to 1000 nm 

● Small and lightweight

Measurement principle

The Q8341 uses a Michelson interferometer. In this arrangement, the light from the device-under-test is split and travels down two paths (with interference introduced between the two resulting light paths). From this, an interferogram is created. The horizontal axis represents the difference in length (i.e., time or phase) of the two light paths. In contrast, the vertical axis represents the interference light intensity. This is the autocorrelation of the device-under-test. Performing an FFT on this function then yields the power spectrum. To help with this, a He-Ne laser is used as the wavelength reference source.

BENEFITS

High-speed measurement option: 0.5 s. 

Ideal for manufacturing/production environments 

The Q8341 measures a full span in approx. 0.5 seconds. This feature makes the Q8341 ideal for laser and light-emitting diode production lines. In addition, this fast measurement speed is ideal for high throughput environments.

Main Features

Wavelength Measurement Range: The Advantest Q8341 has a wide range of wavelength measurements covering the short wavelength region from 350nm to 1000nm, which is suitable for testing of short wavelength laser diodes and other optical devices.

High Accuracy & High Resolution:

Wavelength accuracy: ±0.05nm/±0.01nm, ensuring the accuracy of measurement results.

Wavelength resolution: 0.05nm/0.01nm, capable of finely resolving small differences in the spectrum.

High sensitivity: -50 to +10dBm sensitivity in the input range, capable of capturing weak optical signals.

Fast test speed: The test speed can be up to 1.5s or less, and when the high-speed scanning option is installed, the test speed is even increased to 0.5s or less, which greatly improves the test efficiency.

Advanced Optical System: Adopting Michelson interferometer or Fourier Transform Interferometer, it can provide high-precision spectral analysis in a wide range of wavelengths.