ADVANTEST R6245 Voltage Current Source

ADVANTEST R6245 Voltage Current Source

DESCRIPTION

Lowering the cost of test for the newest double data rate (DDR) and Flash memory ICs demands an efficient test solution offering both performance and throughput. ADVANTEST’s M6245 test handler delivers industry-leading productivity while minimizing downtime, resulting in the most efficient and economical test solution for advanced memory devices.

Pin-point positioning accuracy

Using a precision visual-alignment system, the M6245 handler can achieve contact accuracy to within 0.3 mm ball pitch. In addition to improving test yields, this enables faster set-up and calibration for maximum throughput. Visual alignment also allows the system to accommodate finepitch devices. For memory ICs with current pitch designs, the handler can be easily switched to mechanical alignment.

Advanced thermal technology

ADVANTEST’s proprietary dual-fluid design maintains the temperature of each DUT within ±1˚C across the range of -20˚C to 100˚C and within ±2˚C over the ranges of -40˚C to -20.1˚C and 100.1˚C to 125˚C. With this technology, devices that operate over wide temperature spans can be more accurately tested under real-world conditions.

Optimized for productivity

The handler’s highly automated operation is geared to achieve maximum productivity. For example, DUTs that do not pass functional testing on the first trial are automatically run through the system again for re-testing. This helps to ensure the highest possible yield while also reducing operators’ workloads

Due to features such as the trigger link function and the sequence programming function which automatically performs a series of evaluation tests automatically, the new R6245/6246 enable much more efficient evaluation tests.

 ■ High Measurement Accuracy of ±620000 Columns, 0.02%

High Measurement Resolution of 1 mV, 10 fA 

 ■ High source Accuracy of ±62000 Columns, 0.03%

 Wide source Range of ±220 V, ±20 A

 ■ High Throughput, 0.8 V/µs (At Current Measurement Range of 6 mA or more)

 ■ Wide Variety of Measurement Functions

 • 4 Phenomenon Output (Source/Sink)

 • Up to 5 V Remote Sense

 • Minimum Step 700 µs Sweep Measurement (Generation, Measurement, Data Storage)

 • Range Switching without Discontinuous Output

 • Pulse Measurement with Minimum Pulse Width of 100 µs

 • Synchronized 2-Channel Measurement Function

 • Search measurement function

External measurement input: When the current range is measuring

an applied voltage at the MEASURE INPUT terminal, the

measured voltage is displayed in the set current range

Voltage measurement accuracy ±(0.02% of reading + 120 µV)*1

Current display accuracy ±(0.375% of reading + 7.6 µA)*2

Maximum allowable applied voltage ±250 V peak max.

External analog input: When an external analog signal is added from the ANALOG INPUT terminal, the output added to the generation value of the set generation range can be obtained.

2 types of gain can be selected. Input and output ranges are decided by the source range.

Voltage source accuracy ±(0.16% of setting + 3.8 mV)*1

Current source accuracy ±(0.5% of setting + 10 µA)*2

Maximum input frequency FAST: 10 kHz, SLOW: 1 kHz, at ±6 V

output voltage, 6 mA to 6 A current range, full-scale

Maximum allowable applied voltage ±10 V peak max.

Input resistance Approx. 10 M Ω